QUANTAX EDS for TEM

XFlash 7T: Experience Nano in Color with STEM EDS in TEM and SEM. Optimize Results for Each Microscope. Unmatched upper energy limit. Pinpoint and quantify all elements precisely. Choose from 3 quantification methods, using theoretical and experimental Cliff-Lorimer factors, Zeta-factors, and interpolated missing Zeta-factors. Analyze high-energy TEM-specific elements above 40 keV for clear results. Trace periodic structures (atoms, layers) with steadfast stability and enhanced drift correction.

• Unmatched Upper Energy Limit: Unprecedented performance
• Identify and Quantify All Elements with Unwavering Accuracy
• Versatile Quantification: Three Approaches for All Scenarios
• TEM-Specific High Energy Lines for Precise Results
• Select from Three Essential Background Models
• Included Absorption Correction for Enhanced Quantification
• Real-Time Data Acquisition for In-Situ Experiments
• Streamlined Automation for Data Acquisition and Analysis
• Minimal Post-Acquisition Corrections for Clean Data
• Expert Quantification for EDS Data
• Premium Assistance and Training for Optimal Performance